Noncontact atomic force microscopy
نویسنده
چکیده
No other method has opened the door to progress in nanoscience and nanotechnology as much as the introduction of scanning probe methods did in the 1980s, since they offer a way to visualize the nanoworld. For maximum impact, however, the ability to image and manipulate individual atoms is the key. Initially, scanning tunneling microscopy was the only scanningprobe-based method that was able to achieve this resolution. Atomic force microscopy (AFM), on the other hand, was quickly developed into a versatile tool with applications ranging from materials characterization in ultrahigh vacuum and nanofabrication under ambient conditions, to biological studies in liquids, but its resolution was limited to the nanometer scale.
منابع مشابه
Direct Comparison Between Phase Locked Oscillator and Direct Resonance Oscillator in the Noncontact Atomic Force Microscopy Under Ultrahigh Vacuum
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